Principal Investigator
Alex Demkov is a professor of Physics at The University of Texas at Austin. He received his Ph.D. in theoretical physics in 1995 from Arizona State University (ASU). In 1995-1997, he was a postdoctoral researcher at ASU. In 1997-2005, he was a principal staff scientist in Motorola.s R&D organization providing theoretical support for the development of low- and high-k dielectric materials. In 2005, he joined the faculty of the Physics Department at the University of Texas at Austin. Prof. Demkov has published over 200 research papers and has been awarded nine U.S. patents. He has written, contributed to and edited several books. Demkov received the 2006 NSF CAREER award, 2011 IBM Faculty Award, and 2014 Excellence in Leadership Award of the American Vacuum Society. He is a Senior Member of IEEE and Fellow of the American Physical Society.
Senior Research Scientist
Agham Posadas is managing the Oxide MBE lab at the University of Texas at Austin. He received his Ph.D. in Applied Physics from Yale University in 2007, and his M.S. in Materials Science and Engineering (in 1997) and B.S. in Applied Physics (in 1994) from the University of the Philippines. His prior scientific work includes bulk growth and characterization of high-Tc superconductors at the University of the Philippines, and fabrication of Si and SiGe heterostructures using molecular beam epitaxy (MBE) as a research student at the University of Tokyo. At Yale, his Ph.D. research involved the growth and characterization of functional oxide thin films on semiconductors using both rf sputtering and MBE. He also has expertise in magnetic and transport measurements as well as in thin film crystallographic characterization using four-circle x-ray diffractometry. He joined the University of Texas at Austin in 2009 becoming one of the principal researchers in the new Materials Physics Laboratory headed by Prof. Demkov. He has co-authored over 20 research papers on various oxide thin film heterostructures and a chapter in a new textbook on ferroelectric materials.