%PDF-1.4
%
1 0 obj
<>stream
AIP Publishing LLC
Electronic structure of epitaxially grown and regrown GaN pn junctions characterized by scanning Kelvin probe and capacitance microscopy
Tae-Hyeon Kim
Kai Fu
Chen Yang
Yuji Zhao
Edward T. Yu
J. Appl. Phys.2022.131:015704
aip.org
aip.org
iText 4.2.0 by 1T3XT2022-01-04T06:44:22-08:00
endstream
endobj
2 0 obj
<>
endobj
3 0 obj
<>stream
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