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The Electron Microscope Facility is based in the Texas Materials Institute. Located in the new Engineering Education and Research Center (EER) on main campus provides state-of-the-art characterization.
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The Texas Materials Institute Electron Microscopy Facility provides user access to the University of Texas at Austin community for state-of-the-art atomic scale characterization. Established in 2020, this new facility hosts advanced instruments for the analysis of materials and their preparation. Access information is below. This includes a low-voltage aberration corrected neoARM TEM that can … Read More
TEM
JEOL neoARM Scanning Transmission Electron Microscope. Probe Corrected. 30-200 kV. EELS and EDX Transmission Electron Microscopy (Located in EER 0.750) JEOL neoARM -Accelerating voltages at 30 kV, 80 kV, and 200 kV -Probe Correction for atomic resolution Scanning Transmission Electron Microscopy (STEM) -Atomic-level elemental mapping (EDS and EELS) -Auto tune for fast … Read More