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FIB:SEM

Dual beam FIB/SEM system with EBL capabilities (Located in EER 0.756)
Thermo Scientific Scios 2 HiVac
-High quality TEM sample preparation with Sidewinder HT FIB, Easylift &AutoTEM

-High quality and throughput subsurface and 3D Characterization.

-High contrast UHR imaging with in-lense Trinity detection scheme

-User Guidance for common DualBEam activities

-Auto Slice and View 4 can is used for automated serial milling and imaging

-30Kev EBL system with NPGS

 

 

 

 

 

System characteristics

  • Stage: 110 x110 mm with 65 mm z-travel, 360° rotation, -15° to 90° tilt
  • Easy navigation: 6 megapixels Nav-Cam with 160 x105 mm field of view for on screen sample tracking
  • Large multi-purpose sample holder: 6 X 1/2 inch stubs, 3 x 1/2 inch stubs pre-tilted at 45°, 1 horizontal row holder slot, 1 pre-tilted row holder slot and 1 clamp holder
  • NICol SEM column with Shottky emitter source.
    • Voltage: 200eV  to 30 keV  (20 eV landing with beam deceleration)
    • Current: 1 pA to 400nA
    • resolution: 0.8 nm at 30keV in STEM, 1 nm at 30 k eV (in lense detection),1.6 nm at 1 k eV (in lense detection)
  • Ion column.
    • Voltage: 500V to 30 kV
    • Current: 1.5pA to -65 nA in 15 steps
    • resolution: 3 nm
  • Detectors:
    • Everhart-Thornley secondary electron detector (SED)
    • In-lens T1 and T2 detectors
    • ICE detector for  secondary electron and ion detection
    • Retractable Directional Back Scatter  detector
    • Retractable STEM 3+ detector
    • Micro Analysis detectors:  30 mm windowless EDS detector, WDS detector and EBSD
  • Carbon and Platinum deposition both the SEM and FIB
  • CryoCleaner and charge neutralizer
  • CryoMat for sample cooling up to -60°C
  • QuickLoader for sample transfer without breaking vacuum

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FIB:SEM access details

Access is available to the Thermo Scientific Scios 2 FIB:SEM

  • Hourly fees
    • Trained On-Campus UT Users: $55/h.
    • Higher Ed/State Agencies: $82/h.
    • Corporate Users: $137/h.

    Facility User Education

    To become a user of this instrument please contact Raluca Gearba to schedule a training session. Email:

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Examples of results